Classification of Inter-Turn Short Circuit Faults in Field-Oriented Controlled Electrical Machines using Convolutional Neural Networks

Pham, Huu Duc; Soler, Pablo Garcia; Yu, Xinyi; de Doncker, Rik W.

Piscataway, NJ : IEEE (2023)
Contribution to a book, Contribution to a conference proceedings

In: 2023 IEEE International Electric Machines & Drives Conference (IEMDC) : 15-18 May 2023 : conference location: San Francisco, CA, USA / publisher: IEEE
Page(s)/Article-Nr.: 7 Seiten


  • Chair of Power Electronics and Electrical Drives [614510]